Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition, Optical Science and Engineering | 2 Edition
ISBN:0367402947
ISBN-13: 9780367402945
ISBN-13: 9780367402945
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Details about Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition, Optical Science and Engineering:
The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr
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