GaN Transistor Modeling for RF and Power Electronics: Using The ASM-HEMT Model Woodhead Publishing Series in Electronic and Optical Materials | 1 Edition

Compare Textbook Prices for GaN Transistor Modeling for RF and Power Electronics: Using The ASM-HEMT Model Woodhead Publishing Series in Electronic and Optical Materials 1 Edition ISBN 9780323998710 by Chauhan, Yogesh Singh,Pampori, Ahtisham Ul Haq,Ahsan, Sheikh Aamir
Authors: Chauhan, Yogesh Singh,Pampori, Ahtisham Ul Haq,Ahsan, Sheikh Aamir
ISBN:0323998712
ISBN-13: 9780323998710
List Price: $188.50 (up to 0% savings)
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Details about GaN Transistor Modeling for RF and Power Electronics: Using The ASM-HEMT Model Woodhead Publishing Series in Electronic and Optical Materials:

GaN Transistor Modeling for RF and Power Electronics: Using The ASM-GaN-HEMT Model covers all aspects of characterization and modeling of GaN transistors for both RF and Power electronics applications. Chapters cover an in-depth analysis of the industry standard compact model ASM-HEMT for GaN transistors. The book details the core surface-potential calculations and a variety of real device effects, including trapping, self-heating, field plate effects, and more to replicate realistic device behavior. The authors also include chapters on step-by-step parameter extraction procedures for the ASM-HEMT model and benchmark test results.

GaN is the fastest emerging technology for RF circuits as well as power electronics. This technology is going to grow at an exponential rate over the next decade. This book is envisioned to serve as an excellent reference for the emerging GaN technology, especially for circuit designers, materials science specialists, device engineers and academic researchers and students.

  • This book provides an overview of the operation and physics of GaN-based transistors
  • All aspects of the ASM-HEMT model for GaN circuits, an industry standard model, are described in depth by the developers of the model
  • Parameter extraction of GaN devices and measurement data requirements for GaN model extraction are detailed

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